AEC-Q101
Failure Mechanism Based Stress Test Qualification for Discrete Semiconductors
Qualification standard for discrete semiconductor devices (diodes, transistors, thyristors) in automotive applications. Covers junction temperature cycling, high-temperature reverse bias, and moisture resistance testing.
- Document
- AEC-Q101 Rev. E (2021)
- URL
- https://www.aecouncil.com/AECDocuments.html
- Label
- Standard
- Keywords
- discrete semiconductors automotive qualification diodes transistors temperature cycling moisture resistance AEC
Domain: Semiconductor and Electronics · Standard