AEC-Q100
Failure Mechanism Based Stress Test Qualification for Integrated Circuits
Industry standard for qualifying integrated circuits for automotive use. Defines stress tests organised by failure mechanisms including electromigration, gate oxide integrity, hot carrier injection, and NBTI. Required by automotive OEMs and Tier 1 suppliers.
- Document
- AEC-Q100 Rev. J (2024)
- URL
- https://www.aecouncil.com/AECDocuments.html
- Label
- Standard
- Keywords
- automotive IC qualification stress testing electromigration gate oxide integrity hot carrier injection NBTI AEC
Domain: Semiconductor and Electronics · Standard