Semiconductor and Electronics
14 references
Standards for semiconductor devices, electronic assemblies, and related testing covering automotive component qualification, reliability test methods, PCB fabrication, soldering, and environmental testing for electrical and electronic equipment.
| ID | Title | Label |
|---|---|---|
| Standard | ||
AEC-Q100 |
Failure Mechanism Based Stress Test Qualification for Integrated Circuits | Standard |
AEC-Q101 |
Failure Mechanism Based Stress Test Qualification for Discrete Semiconductors | Standard |
AEC-Q102 |
Failure Mechanism Based Stress Test Qualification for Discrete Optoelectronic Semiconductors in Automotive Applications | Standard |
AEC-Q104 |
Failure Mechanism Based Stress Test Qualification for Multichip Modules in Automotive Applications | Standard |
AEC-Q200 |
Stress Test Qualification for Passive Components | Standard |
IEC-60749 |
Semiconductor devices — Mechanical and climatic test methods | Standard |
IPC-6012 |
Qualification and Performance Specification for Rigid Printed Boards | Standard |
IPC-A-610 |
Acceptability of Electronic Assemblies | Standard |
IPC-J-STD-001 |
Requirements for Soldered Electrical and Electronic Assemblies | Standard |
ISO-16750 |
Road vehicles — Environmental conditions and testing for electrical and electronic equipment | Standard |
ISO-20653 |
Road vehicles — Degrees of protection (IP code) — Protection of electrical equipment against foreign objects, water and access | Standard |
JEDEC-JESD22 |
Reliability Test Methods for Packaged Devices | Standard |
JEDEC-JESD47 |
Stress-Test-Driven Qualification of Integrated Circuits | Standard |
MIL-STD-810 |
Environmental Engineering Considerations and Laboratory Tests | Standard |